Emmanouel Hourdakis received his B.Sc. degree in physics from the University of Crete
in 2001. He received his M.S. (2004) and Ph.D. (2007) degrees in Physics from the
University of Maryland, in collaboration with the National Institute of Standards and
Technology (NIST) at Gaithersburg, USA. He spent several years as a post doctoral
researcher at the Institute of Nanoscience and Nanotechnology (INN) of NCSR
Demokritos in Greece before joining the faculty of the School of Electrical and Computer
Engineering at the National Technical University of Athens as an assistant professor. His
interests focus on the design, fabrication, and characterization of Si-based
microelectronic, energy harvesting, and sensor devices and the electrical and optical
properties of nanostructured materials. His expertise includes deposition techniques for
thin films (thermal evaporation, sputtering), electrochemical creation of nanostructured
materials (porous alumina, porous Si), batch Si processing techniques (photolithography,
e-beam lithography, chemical and plasma etching of materials) and characterization
techniques (electrical, optical, microscopy).